Intergraf Dublin 21st-23rd March

We will participate in Intergraf Dublin 2018, that will be held from the 21st to the 23rd of March. Visit our Booth Nº 49 and touch our products!  


ONYX at Imaginenano 2018

We participated in Imaginenano 2018 from the 13th to the 15th of March. Thanks to everybody for visiting our Booth and for attending to MR.Redó’s talk. Onyx  was really busy! See you soon!


Using THz spectroscopy to analyse atomic layer deposited (ALD) TiN

Oxford Instruments and das-nano demonstrate non-destructive wafer based thickness and resistivity metrology for PEALD TiN. Commonly titanium nitride (TiN) thickness and resistivity wafer fab in-line metrology is based on ellipsometry and 4-point probe resistivity mapping. Alternative and relatively slower or…

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