Onyx

GRAPHENE & 2D MATERIALS CHARACTERIZATION

Onyx

GRAPHENE & 2D MATERIALS CHARACTERIZATION

ONYX

GRAPHENE & 2D MATERIALS CHARACTERIZATION

Onyx is the first system in the market designed to provide a full-area non-destructive characterization of Graphene, thin-films, and other 2D materials. Onyx covers the gap between the macro and the nano scale tools characterizing from 0,5 mm2 to large areas (m2), enhancing the industrialization of the research materials.

Compared to other large-area methods, such as the four-probe methods, Onyx is capable to measure the spatial distribution of the quality of the sample. Spatial resolution in the order of few hundreds of microns enable the fast characterization of large areas of sample as opposed to microscopic methods such as Raman, SEM, and TEM.

FEATURES

  • Uniformity & Homogeneity inspection
  • Quality control of full sample
  • T-Wave emitter/receptor co-developed with Fraunhofer Institute
  • Sample size: from 1x1mm  to  200x200mm (8”).
  • Customizable inspection area (up to m2).
  • Non-destructive analysis
  • Ultra-Fast – 12 cm2/min
  • HD optical camera
  • Single side inspection
  • No need for sample preparation
  • 3 axis automatic positioning system
  • Robust, full aluminum body

TESTED WITH:

  • Graphene: Monolayer, bi-layer, multi-layer; Inks; Doped; Epitaxial over SiC, Powder & flakes; Graphene Oxide
  • PEDOT
  • Carbon Nanotubes
  • ITO
  • NbC
  • IZO
  • ALD-ZnO
  • GaN
  • MoS
  • Spin Coated Photoresins

TECH SPECIFICATIONS

MAIN SUPPLY UNIT

  • Weigh: 30 kg.
  • Dimensions: 430 x 270 x 460 mm

TRANSCEIVER HEAD

  • Weigh: 2 kg.
  • Dimensions: 260 x 176 x 67 mm

3-AXIS POSITION SYSTEM

  • Voltage: 230 VAC, <200 W
  • Connections: USB, HDMI & Ethernet
  • Weigh: 27 kg.
  • Dimensions: 546 x 401 x 535.5 mm

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