Events

Das-Nano at European Microwave week 2019

Das-nano will attend the next European microwave week 2019 that will start on September 29 and will last until October 4. Six days of workshops and short courses form Europe’s premier microwave, wireless and radar event. Das-nano hosts one of…

Events

Das-Nano at Graphene week 2019

The 14th edition of the leading Graphene Conference in Europe, Graphene Week 2019, will be held at the Marina Congress Center, in Helsinki, Finland( September 23 – 27). This conference organized by the Graphene Flagship brings together the latest innovations…

Events

Das-Nano at IRMMW-THz Conference

From 1-6 September 2019, the city of Paris hosts the 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). Das-nano is participating as an exhibitor (booth nº 22) and our THz team has contributed with a conference paper entitled “THz to…

Events

Das-Nano and GRACE project : Newsletter No.2 published

The objective of the GRACE project is the development of protocols to generate Good Practice Guides for the measurement of the electrical properties of graphene, dealing with contact and non-contact methods. Das-Nano collaborates on this project, developing electrical characterization methods for…

Events

Das-Nano published an article in Micromachines journal mdpi

Congratulations to our THz team! A new scientific article has been published in collaboration with das-Nano in Micromachines, an open access journal with a high impact factor. The manuscript entitled: “Advanced graphene-based transparent conductive electrodes for photovoltaic applications” shows the…

Events

Thank you for visiting us at AEND conference 2019!

das-Nano participated in the 14th AEND Conference organized by the Spanish Society for Nondestructive Testing (AEND) last week in Vitoria, bringing together a large number of companies and experts in the Non-Destructive Testing sector. Thank you for visiting us at our…

Events

US patent granted to das-Nano breakthrough technology

das-Nano’s has been granted US patent 10,267,836 last April 2019 for their quality inspection of thin film materials device Onyx. This device is configured to calculate indicative parameters of the quality of thin film materials based on reflection measurements. By measuring…

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