das-Nano is very proud to announce that it has become an Associate Member of the Graphene Flagship. From das-Nano we want to continue contributing with our terahertz-based inspection technology of graphene to bring this material from the academic world to…
The Graphene Flagship Standardisation Committee (GFSC) announces their new Standardisation Certificate, the first of its kind, and is also announcing the first-ever recipients of this recognition. This award is a tribute to the efforts and expertise of those who have…
The NOTUS project, now just over its Equator, is improving das-Nano’s NOTUS system capacities with the funding of EU H2020’s EIC SME Instrument to help making renewable wind energy a reference in Europe. NOTUS enables the inspection of the full…
The NOTUS project is improving NOTUS capacities with the funding of EU H2020’s EIC SME Instrument to help make renewable wind energy a reference in Europe. Within this framework, a new member of the Notus family has developed and is…
The GRACE project has come to an end and the latest newsletter has been published. Newsletter. No. 5 summarizes GRACE Outputs and Impact after three years of research in developing electrical characterization methods…
das-Nano and its partners in the project GRACE — Developing electrical characterization methods for future graphene electronics — will participate in the Graphene and 2DM Industrial Forum GIF2020 tomorrow May, 27. This one-day online conference will show the latest advances…
The NOTUS project, now just over its Equator, is improving das-Nano’s NOTUS system capacities with the funding of EU H2020’s EIC SME Instrument to help making renewable wind energy a reference in Europe. NOTUS enables the inspection of the full layer…
From 1-6 September 2019, the city of Paris hosts the 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). Das-nano is participating as an exhibitor (booth nº 22) and our THz team has contributed with a conference paper entitled “THz to…
das-Nano participated in the 14th AEND Conference organized by the Spanish Society for Nondestructive Testing (AEND) last week in Vitoria, bringing together a large number of companies and experts in the Non-Destructive Testing sector. Thank you for visiting us at our…
das-Nano’s has been granted US patent 10,267,836 last April 2019 for their quality inspection of thin film materials device Onyx. This device is configured to calculate indicative parameters of the quality of thin film materials based on reflection measurements. By measuring…