Graphene & 2D Materials Characterization
Onyx is the first system in the market designed to provide a full-area non-destructive characterization of Graphene, thin-films, and other 2D materials. Onyx covers the gap between the macro and the nano scale tools characterizing from 0,5 mm2 to large areas (m2), enhancing the industrialization of the research materials.
Compared to other large-area methods, such as the four-probe methods, Onyx is capable to measure the spatial distribution of the quality of the sample. Spatial resolution in the order of few hundreds of microns enable the fast characterization of large areas of sample as opposed to microscopic methods such as Raman, SEM, and TEM.
Dielectric parameters and Absorbed power
Onyx is continuously improving its features offering new results highly increasing its potential. Now, Onyx version 3.4 incorporates dielectric parameters, absorbed power and single frequency features analysis to its previous capabilities.
In just one single measurement, the system is able to provide precisely the following physical properties:
- DC conductance, σDC
- DC resistance, RDC
- Carrier scattering time, 𝜏sc
- Carrier density, Ns
- Carrier mobility, μdrift
And now also:
- Dielectric parameters, ε’ and ε’’
- Absorbed power
- Single frequency features