Terahertz research platform for bulk, thin films and 2D materials
Onyx is the first system in the market designed to provide a full-area non-destructive characterization of Graphene, thin films, and other 2D materials.
Onyx covers the gap between the macro and the nano scale tools characterizing from 0,5 mm2 to large areas (m2), enhancing the industrialization of the research materials.
Compared to other large-area methods, such as the four-probe methods, Onyx is capable to measure the spatial distribution of the quality of the sample. Spatial resolution in the order of few hundreds of microns enable the fast characterization of large areas of sample as opposed to microscopic methods such as Raman, SEM, and TEM.
Onyx in the GRACE Project
Developing electrical characterization methods for future graphene electronics
New characterization models available
Onyx is continuously improving its features offering new results highly increasing its potential. Now, Onyx version 4.0 incorporates two new characterization models to its previous capabilities: Semiconductor thin film model and Two thick substrates model. These new features expand Onyx’s versatility and make it an ideal platform for researching an even wider variety of materials
In just one single measurement, the system is able to provide precisely the following physical properties:
- DC conductance, σDC
- DC resistance, RDC
- Carrier scattering time, 𝜏sc
- Carrier density, Ns
- Carrier mobility, μdrift
And now also:
- Dielectric parameters, ε’ and ε’’
- Absorbed power
- Single-frequency features