Onyx

Terahertz research platform for bulk, thin films and 2D materials 

Onyx

Terahertz research platform for bulk, thin films and 2D materials 

ONYX

Terahertz research platform for bulk, thin films and 2D materials

Onyx is the first system in the market designed to provide a full-area non-destructive characterization of Graphene, thin-films, and other 2D materials. Onyx covers the gap between the macro and the nano scale tools characterizing from 0,5 mm2 to large areas (m2), enhancing the industrialization of the research materials.

Compared to other large-area methods, such as the four-probe methods, Onyx is capable to measure the spatial distribution of the quality of the sample. Spatial resolution in the order of few hundreds of microns enable the fast characterization of large areas of sample as opposed to microscopic methods such as Raman, SEM, and TEM.

Onyx in the GRACE Project

Developing electrical characterization methods for future graphene electronics

das-Nano collaborates on the GRACE Project, developing electrical characterization methods for future graphene electronics, such as Terahertz technology used by the Onyx device.

ONYX

New characterization models available

Onyx is continuously improving its features offering new results highly increasing its potential. Now, Onyx version 4.0 incorporates two new characterization models to its previous capabilities: Semiconductor thin-film model and Two thick substrates model. These new features expand Onyx’s versatility and make it an ideal platform for researching an even wider variety of materials

In just one single measurement, the system is able to provide precisely the following physical properties:

  • DC conductance, σDC
  • DC resistance, RDC
  • Carrier scattering time, 𝜏sc
  • Carrier density, Ns
  • Carrier mobility, μdrift

 

And now also:

  • Dielectric parameters, ε’ and ε’’
  • Absorbed power
  • Single-frequency features
  • Thickness

FEATURES

  • Uniformity & Homogeneity inspection
  • Electrical Conductance and Resistance
  • Electrical Mobility and Carrier Density
  • Quality control of full sample
  • T-Wave emitter/receptor co-developed with Fraunhofer Institute
  • Sample size: from 1x1mm  to  200x200mm (8”).
  • Customizable inspection area (up to m2).
  • Non-destructive analysis
  • Ultra-Fast – 12 cm2/min
  • HD optical camera
  • Single side inspection
  • No need for sample preparation
  • 3 axis automatic positioning system
  • Robust, full aluminum body

TESTED WITH:

  • Graphene: Monolayer, bi-layer, multi-layer; Inks; Doped; Epitaxial over SiC, Powder & flakes; Graphene Oxide
  • PEDOT
  • Carbon Nanotubes
  • ITO
  • NbC
  • IZO
  • ALD-ZnO
  • GaN
  • MoS
  • Spin Coated Photoresins

TECH SPECIFICATIONS

MAIN SUPPLY UNIT

  • Weigh: 30 kg.
  • Dimensions: 430 x 270 x 460 mm

TRANSCEIVER HEAD

  • Weigh: 2 kg.
  • Dimensions: 260 x 176 x 67 mm

3-AXIS POSITION SYSTEM

  • Voltage: 230 VAC, <200 W
  • Connections: USB, HDMI & Ethernet
  • Weigh: 27 kg.
  • Dimensions: 546 x 401 x 535.5 mm

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